Reflection high-energy electron diffraction (RHEED) is a method to monitor the growth of thin film, the basic material for manufacturing solar panels. RHEED pattern analysis is applied to ensure that the surface of the material is formed in high quality. It is used in research and development facilities as well as during the manufacturing process. The production parameters are monitored and processed in real-time so that corrections can be made in a timely manner. This kind of in-line monitoring gives manufacturers a competitive advantage, since it helps to significantly lower the cost of thin film, and ultimately the price of the final product.